{"id":1067,"date":"2025-03-29T09:14:38","date_gmt":"2025-03-29T01:14:38","guid":{"rendered":"https:\/\/firstnanosystem.com\/?post_type=product&#038;p=1067"},"modified":"2025-04-30T17:33:39","modified_gmt":"2025-04-30T09:33:39","slug":"candela-7100","status":"publish","type":"product","link":"https:\/\/firstnanosystem.com\/en\/product\/candela-7100","title":{"rendered":"Candela\u00ae 7100 Series"},"content":{"rendered":"<p><span style=\"font-size: 16px;\">The Candela\u00ae 7100 series advanced defect detection and classification system is designed specifically for analyzing hard disk drive (HDD) substrates and media. This HDD analyzer\u2019s high-powered dual-wavelength laser enables classification of unique defect signatures, maximizing yield and lowering total cost of inspection. Multi-channel scatter detectors provide enhanced sensitivity for classification of sub-micron pits, bumps, particles, and buried defects on a full range of substrates. The Candela 7110 configuration supports manual loading of substrates for inspection, while the Candela 7140 provides fully automated cassette-to-cassette substrate loading. Both the capability and stability of the Candela 7100 series defect inspector enable one platform to be used for multiple process control application points.<\/span><\/p>\n<p>&nbsp;<\/p>\n<p><span style=\"font-size: 16px;\">A high sensitivity (HS) option provides enhanced sensitivity and capture rate for both bare glass and metal substrate inspection.<\/span><\/p>","protected":false},"excerpt":{"rendered":"<p>Candela 7100\u7cfb\u5217\u4e3a\u786c\u76d8\u9a71\u52a8\u5668\u57fa\u677f\u548c\u4ecb\u8d28\u63d0\u4f9b\u4e86\u9ad8\u7ea7\u7f3a\u9677\u68c0\u6d4b\u548c\u5206\u7c7b\u529f\u80fd\u30027100\u7cfb\u5217\u786c\u76d8\u9a71\u52a8\u5668\u7f3a\u9677\u68c0\u6d4b [&hellip;]<\/p>","protected":false},"featured_media":1072,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false},"product_brand":[],"product_cat":[24,58,48],"product_tag":[],"class_list":{"0":"post-1067","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-semiprocess","7":"product_cat-celiang","8":"product_cat-defect-inspectors","10":"first","11":"instock","12":"featured","13":"shipping-taxable","14":"product-type-simple"},"acf":[],"_links":{"self":[{"href":"https:\/\/firstnanosystem.com\/en\/wp-json\/wp\/v2\/product\/1067","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/firstnanosystem.com\/en\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/firstnanosystem.com\/en\/wp-json\/wp\/v2\/types\/product"}],"replies":[{"embeddable":true,"href":"https:\/\/firstnanosystem.com\/en\/wp-json\/wp\/v2\/comments?post=1067"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/firstnanosystem.com\/en\/wp-json\/wp\/v2\/media\/1072"}],"wp:attachment":[{"href":"https:\/\/firstnanosystem.com\/en\/wp-json\/wp\/v2\/media?parent=1067"}],"wp:term":[{"taxonomy":"product_brand","embeddable":true,"href":"https:\/\/firstnanosystem.com\/en\/wp-json\/wp\/v2\/product_brand?post=1067"},{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/firstnanosystem.com\/en\/wp-json\/wp\/v2\/product_cat?post=1067"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/firstnanosystem.com\/en\/wp-json\/wp\/v2\/product_tag?post=1067"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}