{"id":896,"date":"2025-02-14T06:20:59","date_gmt":"2025-02-13T22:20:59","guid":{"rendered":"https:\/\/firstnanosystem.com\/?post_type=product&#038;p=896"},"modified":"2025-04-30T17:49:08","modified_gmt":"2025-04-30T09:49:08","slug":"zeta-300","status":"publish","type":"product","link":"https:\/\/firstnanosystem.com\/en\/product\/zeta-300","title":{"rendered":"Zeta\u2122-300 Optical Profiler"},"content":{"rendered":"<p>Zeta<sup>\u2122<\/sup>-300 optical profiler provides 3D metrology and imaging capability, combined with an integrated isolation table and configuration flexibility to handle larger samples. The 3D optical metrology system is powered by ZDot<sup>\u2122\u00a0<\/sup>technology, which simultaneously collects high-resolution 3D data and a True Color infinite focus image. The Zeta-300 non-contact 3D profiler supports both R&amp;D and production environments with Multi-Mode optics, easy-to-use software, and a low cost of ownership.<\/p>\n<p>&nbsp;<\/p>\n<p>The Zeta-300 optical profiler is a non-contact, 3D surface topography measurement system. The Zeta-300 builds on the capability of the Zeta-20 3D profiler with additional isolation options and configuration flexibility to handle larger samples. The 3D optical metrology system is powered by patented ZDot technology and Multi-Mode optics, enabling measurement of a variety of samples: transparent and opaque, low to high reflectance, smooth to rough texture, and step heights from nanometers to millimeters.<\/p>\n<p>&nbsp;<\/p>\n<p>The Zeta-300 optical profiler non-contact measurement system integrates six different optical metrology technologies in one configurable and easy-to-use system. ZDot measurement mode simultaneously collects a high-resolution 3D optical scan and a True Color infinite focus image. Other 3D optical metrology techniques include white light interferometry, phase shifting interferometry, Nomarski interference contrast microscopy, and shearing interferometry. Film thickness can be measured with ZDot or an integrated broadband reflectometer. The Zeta-300 is also a high-end microscope that can be used for sample review or automated defect inspection. The Zeta-300 3D profiler supports both R&amp;D and production environments by providing comprehensive step height, roughness, and film thickness measurements and defect inspection capability.<\/p>","protected":false},"excerpt":{"rendered":"<p>Zeta\u2122-300\u53ef\u63d0\u4f9b3D\u91cf\u6d4b\u548c\u6210\u50cf\u529f\u80fd\uff0c\u4e0e\u96c6\u6210\u5f0f\u9632\u9707\u53f0\u548c\u7075\u6d3b\u7684\u914d\u7f6e\u76f8\u7ed3\u5408\uff0c\u53ef\u4ee5\u5904\u7406\u66f4\u5927\u7684\u6837\u54c1\u3002\u8be5\u7cfb\u7edf\u91c7\u7528Z [&hellip;]<\/p>","protected":false},"featured_media":898,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false},"product_brand":[],"product_cat":[24,58,45],"product_tag":[],"class_list":{"0":"post-896","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-semiprocess","7":"product_cat-celiang","8":"product_cat-optical-profilers","10":"first","11":"instock","12":"featured","13":"shipping-taxable","14":"product-type-simple"},"acf":[],"_links":{"self":[{"href":"https:\/\/firstnanosystem.com\/en\/wp-json\/wp\/v2\/product\/896","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/firstnanosystem.com\/en\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/firstnanosystem.com\/en\/wp-json\/wp\/v2\/types\/product"}],"replies":[{"embeddable":true,"href":"https:\/\/firstnanosystem.com\/en\/wp-json\/wp\/v2\/comments?post=896"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/firstnanosystem.com\/en\/wp-json\/wp\/v2\/media\/898"}],"wp:attachment":[{"href":"https:\/\/firstnanosystem.com\/en\/wp-json\/wp\/v2\/media?parent=896"}],"wp:term":[{"taxonomy":"product_brand","embeddable":true,"href":"https:\/\/firstnanosystem.com\/en\/wp-json\/wp\/v2\/product_brand?post=896"},{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/firstnanosystem.com\/en\/wp-json\/wp\/v2\/product_cat?post=896"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/firstnanosystem.com\/en\/wp-json\/wp\/v2\/product_tag?post=896"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}