ezAFM+ | Atomic Force Microscope

The ezAFM+ Portable Atomic Force Microscope (AFM) boasts advantages such as portability, simple operation, fast scanning speed, capability to scan large-sized samples, and maintenance-free operation. Additionally, it can quickly locate measurement positions of interest and achieve rapid, high-precision measurements in relevant areas.It is suitable for various nanoscale characterization application scenarios, ranging from scientific research and higher education to rapid 3D surface topography imaging and analysis of samples for industrial users. Its innovative technology has simplified the complex operation of traditional AFMs and also expanded the application scope of traditional AFMs.

ezAFM+ | Atomic Force Microscope

 

The ezAFM+ is our compact atomic force microscope (AFM) system. We offer two different scanner head options, with specifications of 40x40x4 μm and 120x120x40 μm respectively.

Samples can be moved manually, and optional motorized or manual sample stages are also available. The XY manual sample positioner has a range of 2×2 mm and a resolution of 10 μm, while the XY motorized sample positioner offers a range of 38×38 mm and a resolution of 1 μm.

 

Optional AQUA (Liquid Mode) Scanner Head

We offer an optional AQUA scanner head, which enables the system to operate in liquid mode. This function can be used in combination with the ILM module, as shown in the figure.

The ILM system consists of three components: the ezAFM scanner head, the XY flexure stage, and the ezAFM–ILM adapter stage. The XY flexure stage moves the cantilever position within a range of 2 mm. Coaxial illumination serves as the system’s top light source; in addition to the ezAFM camera integrated inside the ezAFM, both the cantilever and the sample can be observed from the ILM. The coarse Z-stage is adjusted for thicker samples.

Robust and Flexible

The design of the ezAFM allows users to replace/swap scanner heads easily, safely, and frequently. Each system can be equipped with scanner heads tailored for different scanning sizes, Z-ranges, or air/liquid media.

Ease of Use

In most commercial AFMs, replacing a cantilever can be a challenging task for users, as it involves realigning the laser and photodiode after each cantilever replacement. Nanomagnetics Instruments Limited has simplified this procedure by leveraging the fact that a large number of commercially available cantilevers feature alignment grooves on the back of the chip. Our scanner heads are designed with specially engineered "alignment chips" that position the cantilever in the same relative location to the laser beam when installed, eliminating the need to realign the laser or photodiode.

Compact and Portable

The ezAFM has a footprint of only 70 cm × 30 cm (including the laptop) and requires minimal operating space. It is lightweight and packaged in a durable Pelican case, making it easy to transport or store. In scenarios where enhanced environmental control is needed, the microscope can also be placed inside the case.

Versatile

NanoMagnetics Instruments offers two different scanner heads for the ezAFM, designed to operate under ambient conditions. The ezAFM120 scanner head has a maximum scanning area of up to 120×120×40 μm.适合It is suitable for samples with rough surfaces and provides a Z-resolution of 0.2 nm. Its 40 μm Z-range is significantly larger than that offered by most commercial systems, enabling imaging of samples with a wider range of corrugations, such as textiles, fibers, and pulp. On the other hand, the ezAFM40 scanner head has a maximum scanning area of 40×40×4 μm and a resolution of 0.02 nm (Z-axis), allowing you to scan the surface of single-layer graphene. Additionally, while the typical sample size for the ezAFM is 10×10×5 mm, the system can be easily reconfigured to image very large surfaces.

 

Technical Specification

 

  • Alignment-Free Cantilevers, Commercially Available

  • Scanning Range: 120×120×40 μm or 40×40×4 μm

  • Operating Modes: Contact Mode, Dynamic/Phase Imaging, Lateral Force Microscopy (LFM), and Magnetic Force Microscopy (MFM)

  • Noise Floor: 65 fm/√Hz

  • Integrated Optical Microscope Resolution: 2 μm

  • Camera Parameters: 8.0 Megapixels, Field of View (FOV) 390×230 μm, Resolution 3264×2448 Pixels, 30 Frames Per Second (FPS)

  • Analog-to-Digital (A/D) / Digital-to-Analog (D/A) Converters: 24 Bits

  • Digital Feedback: Equipped with Field-Programmable Gate Array/Digital Signal Processor (FPGA/DSP)

  • Sample Size: 10×10×5 mm (Configurable or Unrestricted)

  • Interface: USB

  • User License: Unlimited

  • Software Updates免费

  • Configurable Side-View Camera

 

Extended Imaging Options

 

  • Scanning Tunneling Microscope (ezSTM)

  • Liquid Cell

  • Electrochemical Cell

  • Heating/Cooling Stage (Temperature Range: -30°C to 250°C)

 

Optional Component

 

  • Signal Access Module

  • Motorized XY Sample Positioning Stage with 38 mm Travel Range

  • Manual XY Sample Stage with 2 mm Travel Range

 

 

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