LT-sSNOM | Low Temperature Microscope

LT-sSNOM has the capability of near-field imaging and spectroscopy together with other AFM modes such as contact, dynamic, MFM, cAFM, KPFM, PRFM. The tip-sample interface is illuminated by off axis parabolic mirror and scattered light is detected by heterodyne interferometer.

LT-sSNOM | Low Temperature Microscope

 

  • 532nm-20μm wavelength range with metallic mirors

  • AFM with fiber interferometer

  • Piezo scanner,30x30x15μm Scan area ②4K

  • 6x6x12mm Range XYZ Sample Nanopositioner

  • 4x4x6mm Range XYZ Nanopositionerfor Off Axis Parabolic miror

  • Resistive Position Sensor with 200 nm resolution

  • 49mm Outer Diameter

  • 10mKto 300K temperature range

  • Up to 31T Magnetic Field

  • Sample holder with 8electrical contacts

  • Contact/Dynamic/ncAFM/MFM/cAFM/KPFM/PRFM/EFM modes

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