Candela® 7100 Series
The Candela® 7100 series advanced defect detection and classification system is designed specifically for analyzing hard disk drive (HDD) substrates and media. This HDD analyzer’s high-powered dual-wavelength laser enables classification of unique defect signatures, maximizing yield and lowering total cost of inspection. Multi-channel scatter detectors provide enhanced sensitivity for classification of sub-micron pits, bumps, particles, and buried defects on a full range of substrates. The Candela 7110 configuration supports manual loading of substrates for inspection, while the Candela 7140 provides fully automated cassette-to-cassette substrate loading. Both the capability and stability of the Candela 7100 series defect inspector enable one platform to be used for multiple process control application points.
A high sensitivity (HS) option provides enhanced sensitivity and capture rate for both bare glass and metal substrate inspection.
