Alpha-Step® D-500 Stylus Profiler

Alpha-Step® D-500

The Alpha-Step D-500 stylus profiler supports 2D measurements of step height, roughness, bow and stress. The innovative optical lever sensor technology offers high resolution measurements, large vertical range and low force measurement capability.

 

An advantage of the profilometer’s stylus measurement technique is that it is a direct measurement, independent of material properties. Adjustable force and choice of stylus enable accurate measurements of a wide variety of structures and materials. This enables quantification of your process to determine the amount of material added or removed, plus any changes in structure by measuring roughness and stress.

 

Designed for universities, research labs and institutes, the Alpha-Step provides step height, roughness, and stress metrology for semiconductor and compound semiconductor devices, LEDs, solar, MEMS, automotive and medical devices.

Features

Step Height: Nanometers to 1200µm

Low Force: 0.03 to 15mg

Video: 5MP high-resolution color camera

Keystone Correction: Removes distortion due to side view optics

Arc Correction: Removes error due to arc motion of the stylus

Compact Size: Small system footprint

Software: User friendly software interface

 

 



Industries

Universities, research labs and institutes

Semiconductor and compound semiconductor

LED: Light emitting diodes

Solar

MEMS: Micro-electro-mechanical systems

Automotive

Medical devices

And more: Contact us with your requirements

 

 

Applications

Step Height Measurement: 2D step height

Texture: 2D roughness and waviness

Form: 2D bow and shape

Stress: 2D thin film stress

 

 

 

 

 

 

 

Stylus Options

The Alpha-Step D-500 has a variety of styli available to support the measurement of step heights, high aspect ratio steps, roughness, sample bow, and stress. The tip radius ranges from 100nm to 50µm and determines the lateral resolution of the measurement. The included angle ranges from 20 to 100 degrees, which specifies the maximum aspect ratio of the measured feature. All styli are manufactured from diamond to reduce wear and increase stylus lifetime.

Sample Chucks

The Alpha-Step D-500 has a range of chucks available to support application requirements. The standard chuck is a nickel-plated aluminum chuck for samples up to 140mm. A flat black chuck is available for transparent samples to minimize reflection from the chuck surface. A universal vacuum chuck is also offered and includes precision locating pins for samples from 50mm to 125mm. Both the standard and universal chucks support stress measurements with 3-point locators to hold the sample in a neutral position for accurate bow measurements.

Step Height

Alpha-Step D-500 探针式轮廓仪能够测量几纳米到 1200 微米高的2D台阶。这能够对蚀刻、溅射、沉积、旋涂、化学机械研磨和其他工艺等沉积或去除的材料厚度进行量化。Alpha-Step系列能够提供微力测量,可以测量软材料,例如光刻胶。

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