ezAFM | Atomic Force Microscope
AFM, like optical and electron microscopy, has become a standard method for materials characterization due to its versatility, allowing for resolutions down to the nanoscale scale and beyond. AFM can function in a variety of conditions, from ultra-high vacuum to liquids, and so is applicable to a wide range of fields, including physics, chemistry, biology, and materials research.
核心优势
扫描区域宽泛 120 x 120 x 40 μm or 40 x 40 x 4 μm ( XYZ )
结构紧凑小巧, 易安装, 使用方便, 随身携带
各部件分离设计, 商用自由对准悬臂
Software Upgrade
1小时内完成安装
使用电压低
Technical Specification
·Alignment free cantievers,commercially Bvalable
·120x120x40μm or 40x40x4μm scan range
·65m/Hz noise floor
·2um resolutionintegrated optical microscope
Z-Axis Resolution < 0.2 nm at 120 μm x 120 μm Scanning Range
Z-Axis Resolution < 0.02 nm at 40 nm x 40 μm Scanning Range
Full HD Camera, 390×230 μm, 2,516×1,960 Pixels, 30 fps
24-Bit ADCs/DACs
Digital Feedback FPGA/DSP
Software Upgrade
Wireless User License
USB Interface
Sample Size 10 x 10 x 5 mm (Configurable for Unrestricted Sample Size)
Scanning Modes:Intermittent Contact Mode,Phase Imaging / Phase Contrast，Contact Mode / Static Force,Lateral Force Microscopy (LFM),Magnetic Force Microscopy (MFM),Electrostatic Force Microscopy (EFM),Piezoresponse Force Microscopy (PRFM),Kelvin Probe Force Microscopy (KPFM)
Force Modulation,Conductive AFM (c-AFM),Scanning Spreading Resistance,Microscopy (SSRM),Multispectral Mode,Lithography and Manipulation Mode,Liquid Mode
