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hpAFM | Atomic Force Microscope

hpAFM is an advanced atomic force microscope that brings a new level of performance, functionality, design and capability. It’s designed to minimize the time to get best results. Whether you can work in liquid or in air conditions, it is for everyone from material science to life science. hpAFM offers excellent features such as alignment-free design, closed loop flexure scanner, decoupled z scanner, 10 MP video microscope and flexible operating modes.

hpAFM | Atomic Force Microscope

 

Scanner

 

  • XY Scan Range Options:10μm/100um with 24 Bit Resolution

  • Z Scan Range Options:5μm/15μm with 24 Bit Resolution

  • 0.01nm resolution

  • XYZ Closed loop operation

  • Vacuum sample holder for up to 8"wafers

  • Decoupled Z scanner

  • Can hold samples up to 500 gr max.

 

Z Motorised Stage

 

  • 50mm range.250nm resolution

 

XY Motorised Stage

 

  • 76mm range,50nm resolution

 

AFM Module

 

  • RF modulated low noise 635nm laser

  • 25 fm/Hz(max.)noise floor

  • <14nm magnetic resolution with super sharp cantilevers

  • Video Microscope,x10 Objective,0.28 NA,motorised focus,1μm optical resolution,x1-5 motorised optical zoom,8MP CMOS camera,Software adjustable white light source,Side view camera

 

Acoustic and Vibration lsolation

 

  • Acoustic,thermal and vibrationisolation cabinet

  • Acoustic,thermal and vibrationisolation cabinet

  • 0.5Hz vibration isolation table in XYZ directions

  • Heating and cooling between -30℃ and+350℃

 

Standard Modes

 

  • Contact Mode AFM

  • Dynamic Mode AFM

  • Lateral Force Microscope

  • Phase Imaging

  • Magnetic Force Microscope,MFM

  • F-d Curves and Spectroscopy

  • Electrostatic Force Microscope,EFM

  • Non-contact AFM with 5mHz Resolution Digital PLL

 

Optional Microscopy Modes

 

  • Current Sensing AFM(Spreading Resistance AFM)

  • Nanolithography

  • Viscoelasticity Measurements

  • Adhesion Force Imaging

  • Conductive AFM

  • Scanning Kelvin Probe Microscopy

  • Force Modulation Microscopy,FMM

  • Electrochemical AFM with Potentiostat

  • Piezo Response Force Microscopy,PRFM

  • Closed Liquid Cell AFM

  • Nanoindentation and Scratch Testing

  • Scanning Tunneling Microscopy

  • Nano Mechanical Imaging,NMI

  • Scripting

  • Dynamic Lateral Force

  • Scanning Microwave Microscope,SMM

  • In plane /out of plane magnetic field(±0.5T inX, ±0.12 Tin Z)

  • Scanning Thermal Microscopy(SThM)

 

Technical Specification

 

  • 3D imaging

  • Image processing,analysis,and recording functions

  • Simultaneous data gathering

  • Up to 8192×8192 pixels imaging

  • Automatic cantilever frequency determination

  • Multi-use licence

  • Lifetime free software updates

  • 24 Bit Scan DAC's

  • 24 Bit Z-DAC resolution

  • FPGA based digital feedback

  • STM and AFM feedbacks

  • 24 Bit 200kHz,16 channel ADC

  • ±10V,16 Bit bias voltage output

  • 5mHz resolution digital PLL Spocifcatons are subjectto change wthout notkce.

 

 

 

 

 

 

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