CN
English
Home
Product
Material Science
Semicon Process
Photoelectric technology
Life Sciences
Support
Equipment Repair
Prototype experience
Consumables Ordering
Events
News
Company
About Us
HR
Partner
contact us
Nanomagnetics Instruments
Mid-Infrared Nanosecond Transient Absorption Spectrometer
ezHEMS | Hall Effect Measurement System
ezAFM | Atomic Force Microscope
ezAFM+ | Atomic Force Microscope
ezSTM | Scanning Tunneling Microscope
hpAFM | Atomic Force Microscope
LT-AFM/MFM | Low Temperature Microscope
LT-SHPM/STM | Low Temperature Microscope
LT-sSNOM | Low Temperature Microscope
NV-CENTRE CONFOCAL MICROSCOPY | Low Temperature Microscope
NMI CRYOSTAT: CRYOGEN FREE ULTRA LOW VIBRATION CRYOSTAT
LT-APO OBJECTIVES | Low Temperature Objective
mK-CONFOCAL/RAMAN MICROSCOPE (mK-CFM/RAMAN) | Low Temperature Microscope
LOW TEMPERATURE XYZ PIEZO SCANNER | Low Temperature Scanner
HEMS & LT-AC/DC | Hall Effect Measurement System
NMI Vibrating Sample Magnetometer
NanoMagnetic Instruments Nanopositioners
hpSPM Controller | for Scanning Probe Microscopes
USB Fiber Interferometer
NMI-PR35 Piezo rotator (360° endless)
NMI-Two Axis Piezo Rotator
Exaddon
CERES µAM Print System.
BELEKTRONIG
BSG-LAB-SERIES: THE FIRST CHOICE FOR APPLICATIONS IN ACOUSTOFLUIDICS
TOHO
FLX Series Precision Surface Stress Analysis
new
ECOPIA
HMS-3000/HMS-5000/HMS-7000 Hall Effect Measurement System
KEITHLEY
4200A-SCS Parameter Analyzer
2600-PCT-xB Parametric Curve Tracer Configurations
707B, 708B Semiconductor Switch Matrix Mainframes (Six-slot and Single-slot Versions)
测量
Alpha-Step® D-600 Stylus Profiler
Alpha-Step® D-500 Stylus Profiler
new
Tencor® P-7 Stylus Profiler
Tencor® P-17 & Tencor® P-17 OF Stylus Profilers
Tencor® P-170 Stylus Profiler
HRP®-260 Stylus Profiler
Filmetrics® Profilm3D® Optical Profilometer
Zeta™-Solar Metallization Optical Profiler
Zeta™-20 Optical Profiler
Zeta™-300 Optical Profiler
iMicro Nanoindenter
iNano® Nanoindenter
Candela® 8720 Surface Defect Inspection System
Candela® 8520 Surface Defect Inspection System
Nano Indenter® G200X Nanoindenter
NanoFlip Nanomechanical Tester
Candela® 8420 Surface Defect Inspection System
Candela® 7100 Series
Zeta™-388 Optical Profiler
Filmetrics® R50-4PP Four-Point Probe System and Filmetrics R50-EC Eddy Current System
Filmetrics® F20 Series Film Thickness Measurement Instruments
Filmetrics® F3-sX Film Thickness Measurement Series
Filmetrics® F10-ARc
Filmetrics® F10-AR
Filmetrics® F10-HC
薄膜
AT 200M – The Most Cost Effective ALD System on the Market
The AT410 is the most cost-effective thermal ALD tool on the market.
AT650/850P 台式等离子原子层沉积设备
AT650/850T 台式热原子层沉积设备
AT 臭氧发生器
AT610 经济性原子层沉积设备
AT810 经济性原子层沉积设备
SPIN150x 高质量基底旋涂机
SPIN200x 高质量基底旋涂机
SPIN300x 高质量基底旋涂机
SPIN450x 高质量基底旋涂机
刻蚀
PACTO-10H/20H Microwave Plasma System For Wafer Processing
new
Tergeo plasma cleaner
TEM and SEM plasma cleaner
KLEEN plasma cleaner
TEM Specimen Holder Storage
High vacuum TEM specimen holder storage, leak check, and plasma cleaning chamber
Gas mixer
Ion Source
Model 200 Mask Alignerand UV Exposure System
Model 212: Economical Large Area Mask Aligner for R&D
Model OAI 800E: Enhanced Front and Backside Semi-automatic Mask Aligner
OAI Model 2000 Edge-bead /UV Flood Exposure Systems
Model 6000 Production Mask Aligners
Model 6020 Large Substrate Production Mask Aligner or Flood Exposure System
Model 659 UV Light & Energy Meter
微组装
WB200系列引线键合机
RSS 系列真空烧结炉回流焊系统
RSS-3X210 紧凑型回流焊系统
RSS-160-SC 紧凑型迷你烧结回流焊系统
VSS-450-300 台式真空烧结炉
HVS 系列高真空封装机
RSO-210 真空烧结炉回流焊系统
RSO-300 真空烧结炉回流焊系统
WB 100-e 焊线机
MOXTEK
Moxtek 小型X光管
Chromacity
920 nm 飞秒激光器
520 nm 飞秒激光器
1040 nm 飞秒激光器
1280 nm 飞秒激光器
OPO 光参量振荡器
品牌3
品牌4
品牌1
品牌2
品牌3
品牌4
Here ：
Home page
>
Events
>
2025第十一届世界雷达博览会
2025第十一届世界雷达博览会
会议时间
2025年5月17日-5月19日
会议地点
安徽合肥滨湖国际会展中心
Related Products
下一篇：CIOE中国光博会，9月邀您参观光电技术盛宴
contact us
我们希望了解您的需求，请填写以下表单并提交
Your Name
邮箱地址
联系电话
您的需求
submit
香港公司办公室电话:
400-9999-185
上海公司办公室电话:
400-9999-185
深圳公司办公室电话：
400-9999-185
